The application of X-ray technology in material analysis is very extensive. We classify X-rays by their two major properties: scattering and absorption.
SAXS:Small angle X-ray scattering,is a technique for studying particle systems to quantify the size distribution and shape of particles.
WAXS:Wide angle X-ray scattering, is a technique for detecting the crystal structure of particles.
XRD:X-ray diffraction, is a technique used to analyze crystal structure.
IXS:Inelastic X-ray Scattering. Among them, Resonant Inelastic Scattering (RIXS: Resonant IXS) is one of the most powerful tools to study the electronic structure of matter.
X-ray CT:X-ray Computed Tomography, widely used in security inspection, medical and other industries.
XRF:X-ray Fluorescence.
XPS:X-ray Photoelectron Spectroscopy, it is a microscopic analysis technique for electronic materials and components.