SAXS：Small angle X-ray scattering，is a technique for studying particle systems to quantify the size distribution and shape of particles.

WAXS：Wide angle X-ray scattering, is a technique for detecting the crystal structure of particles.

XRD：X-ray diffraction, is a technique used to analyze crystal structure.

IXS：Inelastic X-ray Scattering. Among them, Resonant Inelastic Scattering (RIXS: Resonant IXS) is one of the most powerful tools to study the electronic structure of matter.

X-ray CT：X-ray Computed Tomography, widely used in security inspection, medical and other industries.

XRF:X-ray Fluorescence.

XPS:X-ray Photoelectron Spectroscopy, it is a microscopic analysis technique for electronic materials and components.