XF-P1

RSD±2.5%

（1um thickness）

One-click testing

Automatic report

Multilevel analysis

Support up to 4 layers

XF-P3

RSD±1.5%

（1um thickness）

±0.01%( composition )

Support up to 10 layers

Easily test tiny samples

Multiple collimators

XRF-Z8

±0.01g/m²

PET film 

All kinds of release paper

Detection without pretreatment

Test multiple-samples at a time

XF-O2

Analysis elements

AI(No.13)/K(No.19)～Ti(No.22)  Option

±0.03%/±0.01%( option)

Support master/slave model

Support customized design